Fundamentals of bias temperature instability in MOS transistors: characterization methods, process and materials impact, DC and AC modeling

By:

Material type: Book

BookPublication details: New York: Springer, 2016Description: 269 p,: ill.,; 25 cmISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	621.3815 MAH (Browse shelf(Opens below))	Available		023388

Previous								Next
Previous	621.3815 LIA Semiconductor microchips and fabrication: a practical guide to theory and manufacturing	621.3815 LIM Design for high performance, low power, and reliable 3D integrated circuits	621.3815 LOJ History of semiconductor engineering	621.3815 MAH Fundamentals of bias temperature instability in MOS transistors: characterization methods, process and materials impact, DC and AC modeling	621.3815 MAN Digital logic and computer design	621.3815 MAN Digital logic and computer design	621.3815 MAN Digital logic and computer design	Next

Includes bibliographical references and index

There are no comments on this title.

to post a comment.