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1.
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Analysis and modeling of stress over layer induced threshold voltage shift in High-K metal gate MOSFETs by
  • Parihar, Narendra
Material type: Text Book
Publication details: Gandhinagar: Indian Institute of Technology, 2014
Availability: Items available for loan: IIT Gandhinagar (1)Call number: 621.3815284 PAR. Items available for reference: IIT Gandhinagar: Not for loan (1)Call number: 621.3815284 PAR.

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2.
Dealing with difficult people by
  • Harvard Business Review
Series: HBR Emotional Intelligence Series
Publication details: Boston: Harvard Business Review Press, 2018
Availability: Items available for loan: IIT Gandhinagar (1)Call number: 658.3 HAR.

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