High-resolution electron microscopy

By:

Spence, John C. H

Publication details: Oxford University Press, 2013. Oxford:Edition: 4th edDescription: xix, 406p.; pbk; 25cmISBN:

9780198795834

Subject(s):

DDC classification:

502.825 SPE

Summary: High-resolution electron microscopy covers both the practice and theory of atomic-resolution transmission electron microscopy (TEM) in all its modern forms and applications, with the aim of ‘seeing atoms’ This new edition takes full account of the discovery of aberration correction techniques, which now allow electron microscopes to see detail as small as one atom. The type and arrangement of atoms gives materials their properties and organisms their function. The book presents clearly the underlying theory of atomic-resolution TEM and scanning transmission electron microscopy (STEM), and also contains detailed practical advice, with examples. The book includes chapters devoted to cryo-electron microscopy (for biologists) and nanoscience (for materials scientists and condensed matter physicists). Additional chapters are devoted to imaging at atomic resolution in three dimensions, to a review of electron optics, to electron sources and detectors, electron holography, electron microdiffraction methods, phase-contrast theory, the theory of aberration correction, energy-loss spectroscopy, cathodoluminescence in STEM, diagnosis of resolution-limiting factors, experimental technique, data analysis software, auto-tuning, electron Ronchigrams, and the measurement of mechanical and electronic instabilities. https://academic.oup.com/book/26825

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	502.825 SPE (Browse shelf(Opens below))	1	Available		031748

Includes appendix, index and reference

High-resolution electron microscopy covers both the practice and theory of atomic-resolution transmission electron microscopy (TEM) in all its modern forms and applications, with the aim of ‘seeing atoms’ This new edition takes full account of the discovery of aberration correction techniques, which now allow electron microscopes to see detail as small as one atom. The type and arrangement of atoms gives materials their properties and organisms their function. The book presents clearly the underlying theory of atomic-resolution TEM and scanning transmission electron microscopy (STEM), and also contains detailed practical advice, with examples. The book includes chapters devoted to cryo-electron microscopy (for biologists) and nanoscience (for materials scientists and condensed matter physicists). Additional chapters are devoted to imaging at atomic resolution in three dimensions, to a review of electron optics, to electron sources and detectors, electron holography, electron microdiffraction methods, phase-contrast theory, the theory of aberration correction, energy-loss spectroscopy, cathodoluminescence in STEM, diagnosis of resolution-limiting factors, experimental technique, data analysis software, auto-tuning, electron Ronchigrams, and the measurement of mechanical and electronic instabilities.

https://academic.oup.com/book/26825

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