MARC details
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| fixed length control field |
02104 a2200253 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
220813b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780198795834 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
502.825 |
| Item number |
SPE |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Spence, John C. H. |
| 245 ## - TITLE STATEMENT |
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| Title |
High-resolution electron microscopy |
| 250 ## - EDITION STATEMENT |
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| Edition statement |
4th ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Name of publisher, distributor, etc |
Oxford University Press, |
| Date of publication, distribution, etc |
2013. |
| Place of publication, distribution, etc |
Oxford: |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
xix, 406p.; |
| Other physical details |
pbk; |
| Dimensions |
25cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc |
Includes appendix, index and reference |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc |
High-resolution electron microscopy covers both the practice and theory of atomic-resolution transmission electron microscopy (TEM) in all its modern forms and applications, with the aim of ‘seeing atoms’ This new edition takes full account of the discovery of aberration correction techniques, which now allow electron microscopes to see detail as small as one atom. The type and arrangement of atoms gives materials their properties and organisms their function. The book presents clearly the underlying theory of atomic-resolution TEM and scanning transmission electron microscopy (STEM), and also contains detailed practical advice, with examples. The book includes chapters devoted to cryo-electron microscopy (for biologists) and nanoscience (for materials scientists and condensed matter physicists). Additional chapters are devoted to imaging at atomic resolution in three dimensions, to a review of electron optics, to electron sources and detectors, electron holography, electron microdiffraction methods, phase-contrast theory, the theory of aberration correction, energy-loss spectroscopy, cathodoluminescence in STEM, diagnosis of resolution-limiting factors, experimental technique, data analysis software, auto-tuning, electron Ronchigrams, and the measurement of mechanical and electronic instabilities.<br/><br/>https://academic.oup.com/book/26825 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
High resolution electron microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Electron microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Materials--Microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Determinative mineralogy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Optical mineralogy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Electron microscopy--Technique |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
TEM |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Item type |
Books |
