Electromigration in ULSI Interconnections by Cher Ming Tan

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Material type: Book

BookSeries: ; | International series on advances in solid state electronics and technologyCurrent publication frequency: .Publication details: Hackensack World Scientific 2010Edition: Description: xix, 291p.: ill; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	621.3815 TAN (Browse shelf(Opens below))	Available		016690

Includes bibliographical references and index

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