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Electromigration in ULSI Interconnections

Tan, Cher Ming,

Electromigration in ULSI Interconnections by Cher Ming Tan - - Hackensack World Scientific 2010 - xix, 291p.: ill; 24 cm. - - . - International series on advances in solid state electronics and technology. .

Includes bibliographical references and index

ISBN: 9789814273329 =

Nat. Bib. No.:

Nat. Bib. Agency Control No.:

Subjects--Meeting Names:

Subjects--Index Terms: Applied physics Integrated circuits Ultra large scale integration Electrodiffusion

LC Class. No.: /

Dewey Class. No.: 621.3815 TAN

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