Nanometer-scale defect detection using polarized light

By:

Dahoo, Pierre-Richard

Contributor(s):

Material type:

TextPublication details: Wiley, 2024.ISBN:

9781119329657

Subject(s):

DDC classification:

621.38152 DAH

Online resources:

Click here to access e-book

Summary: This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

List(s) this item appears in: IEEE-Wiley Semiconductor Ebooks

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Holdings
Item type	Current library	Call number	Materials specified	URL	Status
E- Books	IIT Gandhinagar	621.38152 DAH (Browse shelf(Opens below))	IEEE-Wiley Semiconductor Ebooks	Link to resource	Available

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

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