Nanometer-scale defect detection using polarized light (Record no. 63158)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01465nam a2200253 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781119329657 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 DAH |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Dahoo, Pierre-Richard |
| 245 ## - TITLE STATEMENT | |
| Title | Nanometer-scale defect detection using polarized light |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Wiley, |
| Date of publication, distribution, etc. | 2024. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.<br/>Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Circuits |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Power |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Devices |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | IEEE-Wiley Semiconductor Ebooks |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Engineered Material |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Dielectrics |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Nanotechnology |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Plasmas |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Pougnet, Philippe |
| Relator term | Co author |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Hami, Abdelkhalak El |
| Relator term | Co author |
| 856 ## - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="https://ieeexplore.ieee.org/servlet/opac?bknumber=10518261">https://ieeexplore.ieee.org/servlet/opac?bknumber=10518261</a> |
| Link text | Click here to access e-book |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | E- Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Materials specified (bound volume or other part) | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | IEEE-Wiley Semiconductor Ebooks | IIT Gandhinagar | IIT Gandhinagar | 30/06/2025 | 621.38152 DAH | 30/06/2025 | https://ieeexplore.ieee.org/servlet/opac?bknumber=10518261 | 30/06/2025 | E- Books |
