000			01925 a2200301 4500
999			_c52411 _d52411
008			200227b ||||| |||| 00| 0 eng d
020			_a9781441971999
082			_a502.825 PEN
100			_aPennycook, Stephen J.
245			_aScanning transmission electron microscopy: imaging and analysis
260			_bSpringer, _c2011. _aDordrecht:
300			_axii; 762 p. _bhb; _c26 cm.
365			_aEURO _b154.99
520			_aScanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
650			_aMaterials Science
650			_aOptical and Electronic Materials
650			_aSolid State Physics
650			_aCondensed Matter Physics
650			_aBiological Microscopy
650			_aCondensed Matter
650			_aSolid State Physics
650			_aElectronic Materials
650			_aNanotechnology
650			_aCharacterization and Evaluation of Materials
650			_aScanning Transmission Electron Microscopy
700			_aNellist, Peter D.
942			_2ddc _cTD