000 | 01026nam a2200385 454500 | ||
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008 | 160319b2010 xxu||||| |||| 00| 0 eng d | ||
015 |
_2 _a |
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016 |
_2 _a |
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020 | _a9789814273329 | ||
040 |
_a _c _d |
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050 |
_a _b |
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082 | _a621.3815 TAN | ||
100 | _aTan, Cher Ming, | ||
222 |
_a _b |
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245 |
_aElectromigration in ULSI Interconnections _b _cby Cher Ming Tan |
||
250 |
_a _b |
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260 |
_6 _aHackensack _bWorld Scientific _c2010 |
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300 |
_axix, 291p.: _bill; _c24 cm. |
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310 |
_a _b |
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440 |
_a _v |
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490 |
_6016690 _aInternational series on advances in solid state electronics and technology. |
||
500 |
_3 _aIncludes bibliographical references and index |
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611 |
_a _c |
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653 | _aApplied physics | ||
653 | _aIntegrated circuits | ||
653 | _aUltra large scale integration | ||
653 | _aElectrodiffusion | ||
906 |
_a _b _c _d _e _f _g |
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923 |
_a _c |
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925 |
_a _b _x |
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955 |
_d _e _f _g _t |
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963 | _a | ||
991 |
_w _t _p _i _h _b |
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999 |
_c36435 _d36435 |