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| 008 | 160319b2009. xxu||||| |||| 00| 0 eng d | ||
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| 082 | _a621.381 VOL | ||
| 100 | _aVoldman, Steven H. ., | ||
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_aESD : failure mechanisms and models _b _cby Steven H. Voldman |
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_6 _aHoboken, N.J. : _bJohn Wiley & Sons, _c2009. |
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_axxiv, 384 p. : _bill; _c25cm. |
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_3 _aIncludes bibliographical references and index. |
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_a _c |
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| 653 | _aApplied physics | ||
| 653 | _aSemiconductors -- Failures. | ||
| 653 | _aIntegrated circuits -- Protection. | ||
| 653 | _aIntegrated circuits -- Testing. | ||
| 653 | _aIntegrated circuits -- Reliability. | ||
| 653 | _aElectric discharges. | ||
| 653 | _aElectrostatics. | ||
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