| 000 | 00946nam a2200373 454500 | ||
|---|---|---|---|
| 008 | 160319bc2006. . xxu||||| |||| 00| 0 eng d | ||
| 015 |
_2 _a |
||
| 016 |
_2 _a |
||
| 020 | _a9780471739067 | ||
| 040 |
_a _c _d |
||
| 050 |
_a _b |
||
| 082 | _a621.38152 SCH | ||
| 100 | _aSchroder, Dieter K., | ||
| 222 |
_a _b |
||
| 245 |
_aSemiconductor material and device characterization _b _cby Dieter K. Schroder |
||
| 250 |
_a3rd ed. _b |
||
| 260 |
_6 _aNew Jersey: _bWiley, _cc2006. . |
||
| 300 |
_axv, 779 p.: _bill; _c25cm. |
||
| 310 |
_a _b |
||
| 440 |
_a _v |
||
| 500 |
_3 _aIncludes bibliographical references and index. |
||
| 611 |
_a _c |
||
| 653 | _aApplied physics | ||
| 653 | _aSemiconductors. | ||
| 653 | _aSemiconductors -- Testing. | ||
| 653 | _aElectronic books. | ||
| 906 |
_a _b _c _d _e _f _g |
||
| 923 |
_a _c |
||
| 925 |
_a _b _x |
||
| 955 |
_d _e _f _g _t |
||
| 963 | _a | ||
| 991 |
_w _t _p _i _h _b |
||
| 999 |
_c28631 _d28631 |
||