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	1.	No cover image available Hotspot detection in lithographic patterns using machine learning technique by Dawar, Rohit Mohapatra, Nihar Ranjan Srinivasan, Babji Material type: Book Publication details: Gandhinagar : Indian Institute of Technology, 2018 Availability: No items available. Request article Add to cart (remove)
	2.	No cover image available Parametric analysis based identification of yield detractor patterns from ULSI layouts by Nath, Biplob Mohapatra, Nihar Ranjan Hegde, Ravi Material type: Book; Format: print ; Literary form: Not fiction Publication details: Gandhinagar : Indian Institute of Technology Gandhinagar, 2020 Availability: Items available for reference: IIT Gandhinagar: Not for loan (1)Call number: 621.3 NAT. Request article Add to cart (remove)

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