Markov random field modeling in image analysis

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Material type: Book

BookSeries: Advances in pattern recognitionPublication details: New York: Springer Science, 2009Edition: 3rd edDescription: xxiii, 357p: ill; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	621.36701 LIS (Browse shelf(Opens below))	Available		016127
Books	IIT Gandhinagar	General	621.36701 LIS (Browse shelf(Opens below))	Available		015420

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