TY  - BOOK
AU  - Epperlein, Peter W. 
TI  - Semiconductor laser engineering, reliability and diagnostics: a practical approach to high power and single mode devices
SN  - 9781118481875
U1  -  621.38152 EPP 
PY  - 2024///
PB  - Wiley
KW  - Components
KW  - Photonics and Electrooptics
KW  - Power, Energy and Industry
KW  - Circuits
KW  - Devices and Systems
KW  - General Topics for Engineers
N1  - Include Index
N2  - This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.

Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities
UR  - https://ieeexplore.ieee.org/book/10513452
ER  -