TY  - BOOK
AU  - Dahoo, Pierre-Richard
AU  - Pougnet, Philippe
AU  - Hami, Abdelkhalak El
TI  - Nanometer-scale defect detection using polarized light
SN  - 9781119329657
U1  - 621.38152 DAH 
PY  - 2024///
PB  - Wiley
KW  - Circuits
KW  - Power
KW  - Devices
KW  - IEEE-Wiley Semiconductor Ebooks
KW  - Engineered Material
KW  - Dielectrics
KW  - Nanotechnology
KW  - Plasmas
N2  - This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale
UR  - https://ieeexplore.ieee.org/servlet/opac?bknumber=10518261
ER  -