Srivastava, Ayush <br/><br/>
Stability analysis of monolayer TMD FET, Si FinFET, and Si NSFET based 6T SRAM for N5 and beyond 

 - Gandhinagar:  Indian Institute of Technology Gandhinagar,  2023. 
 - xii, 57p.;  hbk;  30cm. 
<br/><br/>Includes references. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>21250007<br/>M.Tech<br/>Electrical Engineering<br/>Transition Metal Dichalcogenides (TMD)<br/>Field-Effect Transistors (FET)<br/>6T-SRAM<br/>Read-Static-Noise- Margin (RSNM)
<br/><br/><label>Dewey Class. No.: </label>621.3 SRI