TY  - GEN
AU  - Stout, Ken 
AU  - Blunt, Liam 
TI  - Three dimensional surface topography
SN  - 9781857180268
U1  - 620.440287 
PY  - 2000///
CY  - London
PB  - Penton Press
KW  - Engineering
KW  - Surface Characterization
KW  - Filtering
KW  - Surface Topography
KW  - Topography Analysis
KW  - Visualization Techniques
KW  - Surface Metrology
KW  - Engineered Surfaces
KW  - Tunnelling Microscope
KW  - Surface Integrity
N1  - Includes bibliographical references and index
N2  - This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography
ER  -