TY  - GEN
AU  -  Ma, T. P., Ed.
AU  - Dressendorfer, Paul V. , Ed.
TI  - Ionizing radiation effects in MOS devices and circuits
SN  - 9780471848936
U1  - 621.38152 
PY  - 1989///
CY  - New York
PB  - Wiley
KW  - Metal oxide semiconductors--Effect of radiation on
N1  - "A Wiley-Interscience publication."
Includes bibliographical references and index
ER  -