Ma, T. P., Ed. <br/><br/>
Ionizing radiation effects in MOS devices and circuits 

 - New York :  Wiley,  1989 
 - xviii, 587 p. :   ill. ;   24 cm. 
<br/><br/> "A Wiley-Interscience publication."<br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780471848936 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors--Effect of radiation on.
<br/><br/><label>Dewey Class. No.: </label>621.38152  / MAT