Bushnell, Michael L. <br/><br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits 

 - Boston:  Kluwer Academic,  2000. 
 - 690 p.:  ill.;  26 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>978-0792379911 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration<br/>Digital integrated circuits<br/>Mixed signal circuits<br/>Semiconductor storage devices
<br/><br/><label>Dewey Class. No.: </label>621.395  / BUS