Tolan, Metin, <br/><br/>
X-ray scattering from soft-matter thin films: materials science and basic research   
By Metin Tolan 
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 - New York  Springer  1999 
 - 197 p,:  ill.,;  24 cm. 
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 -   .
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783662142189 
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<br/><br/><label>Nat. Bib. No.: </label>  
<br/><br/><label>Nat. Bib. Agency Control No.: </label>  
<br/><br/><label>Subjects--Meeting Names: </label><br/>  
<br/><br/><label>Subjects--Index Terms: </label>Physics Chemistry Particles Soft condensed matter Surfaces  Thin films X-rays  Scattering Reflectivity experiments 
<br/><br/><label>LC Class. No.: </label> /  
<br/><br/><label>Dewey Class. No.: </label>530.4275 TOL