TY  - BOOK
AU  - Ganeriwala, Mohit D
TI  - Analysis of gate leakage current in high-k metal gate MOS transistors
U1  - 621.381522 GAN 
PY  - 2015///
CY  - Gandhinagar
PB  - Indian Institute of Technology
KW  - 12210050
KW  - M.Tech
KW  - Plastic Deformation
KW  - Frictional Heating
KW  - Thermoplastics
KW  - Resistance-heating Element
KW  - Taguchi Technique
N1  - Includes bibliographical reference
ER  -