Ganeriwala, Mohit D <br/><br/>
Analysis of gate leakage current in high-k metal gate MOS transistors 

 - Gandhinagar  Indian Institute of Technology  2015 
 - 65 p,:  col., ill;  30 cm+  with CD. 
<br/><br/> Includes bibliographical reference 
<br/><br/><label>Subjects--Topical Terms: </label><br/>12210050<br/>M.Tech<br/>Plastic Deformation<br/>Frictional Heating<br/>Thermoplastics<br/>Resistance-heating Element<br/>Taguchi Technique
<br/><br/><label>Dewey Class. No.: </label>621.381522 GAN