TY  - BOOK
AU  - Crouch, Alfred L.,
TI  - Design-for-test for digital IC`s and embedded core systems
SN  - 9780130848277
U1  - 621.3815 CRO 
PY  - 1999///
CY  - New Jersey
PB  - Prentice Hall
KW  - Applied physics
KW  - Automatic test equipment
KW  - Electronic circuit design
KW  - Embedded computer systems
N1  - Includes bibliographical references and index
ER  -