Crouch, Alfred L., <br/><br/>
Design-for-test for digital IC`s and embedded core systems   
by Alfred L. Crouch 
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 - New Jersey:  Prentice Hall,  1999. 
 - 349 p.:  ill.;  24 cm. 
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 -   .
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780130848277 
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<br/><br/><label>Nat. Bib. No.: </label>  
<br/><br/><label>Nat. Bib. Agency Control No.: </label>  
<br/><br/><label>Subjects--Meeting Names: </label><br/>  
<br/><br/><label>Subjects--Index Terms: </label>Applied physics Automatic test equipment Electronic circuit design Embedded computer systems 
<br/><br/><label>LC Class. No.: </label> /  
<br/><br/><label>Dewey Class. No.: </label>621.3815 CRO