TY  - BOOK
AU  - Abramovici, Miron,
AU  - Friedman, Arthur D.,
AU  - Breuer, Melvin A.,
TI  - Digital systems testing and testable design
SN  - 9780780310629
U1  - 621.3815 ABR 
PY  - 1990///
CY  - New Jersey
PB  - Wiley IEEE Press
KW  - Applied physics
KW  - Digital integrated circuits
KW  - Integrated circuits
N1  - Includes bibliographical references and index
ER  -