Bhushan, Bharat, <br/><br/>
Applied scanning probe methods XII characterization   
edited by Bharat Bhushan and Harald Fuchs 
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 - New York  Springer-Verlag  2008 
 - LV, 224p.:  ill;  24 cm. 
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<br/><br/><label>ISBN: </label>9783642098703 
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<br/><br/><label>Nat. Bib. No.: </label>  
<br/><br/><label>Nat. Bib. Agency Control No.: </label>  
<br/><br/><label>Subjects--Meeting Names: </label><br/>  
<br/><br/><label>Subjects--Index Terms: </label>Miscellany Materials microscopy Scanning probe microscopy Industrial applications Industrial applications 
<br/><br/><label>LC Class. No.: </label> /  
<br/><br/><label>Dewey Class. No.: </label>502.82 APP