Gaur, Minoj Singh (Ed.) <br/><br/>
VLSI design and test: 17th international symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, revised selected papers 

 - Heidelberg:  Springer,  2013. 
 - xvi, 388p.:  ill;  24 cm. 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783642420238 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Applied physics  <br/>Very large scale integration<br/>VLSI design <br/>Integrated circuits
<br/><br/><label>Dewey Class. No.: </label>621.395 GAU