Matching properties of deep sub-micron MOS transistors
by Jeroen A. Croon, Willy Sansen and Herman E. Maes
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- New York: Springer Science, 2005.
- x, 206 p: ill; 25 cm.
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- Kluwer international series in engineering and computer science 0893-3405.; 851. .
Includes bibliographical references
9781441937186
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Applied physics Metal oxide semiconductor field-effect transistors