TY  - BOOK
AU  - Tan, Cher Ming,
TI  - Electromigration in ULSI Interconnections
T2  - International series on advances in solid state electronics and technology
SN  - 9789814273329
U1  - 621.3815 TAN  
PY  - 2010///
CY  - Hackensack
PB  - World Scientific
KW  - Applied physics
KW  - Integrated circuits
KW  - Ultra large scale integration
KW  - Electrodiffusion
N1  - Includes bibliographical references and index
ER  -