Tan, Cher Ming, <br/><br/>
Electromigration in ULSI Interconnections   
by Cher Ming Tan 
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 - Hackensack  World Scientific  2010 
 - xix, 291p.:  ill;  24 cm. 
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 -   .
 - International series on advances in solid state electronics and technology. .
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9789814273329 
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<br/><br/><label>Nat. Bib. No.: </label>  
<br/><br/><label>Nat. Bib. Agency Control No.: </label>  
<br/><br/><label>Subjects--Meeting Names: </label><br/>  
<br/><br/><label>Subjects--Index Terms: </label>Applied physics Integrated circuits Ultra large scale integration Electrodiffusion 
<br/><br/><label>LC Class. No.: </label> /  
<br/><br/><label>Dewey Class. No.: </label>621.3815 TAN