TY  - BOOK
AU  - Oldham, Timothy R.,
TI  - Ionizing radiation effects in MOS oxides
SN  - 9789810233266
U1  - 621.38152 OLD  
PY  - 1999///
CY  - Singapore
PB  - World Scientific
KW  - Applied physics
KW  - Semiconductors
KW  - Effects of radiation
KW  - Metal oxide semiconductors
KW  - Effect of radiation on
N1  - Includes bibliographical references
ER  -