Li, Stan Z., , <br/><br/>
Markov random field modeling in image analysis 

 - 3rd ed. 
 - New York:  Springer Science,  2009 
 - xxiii, 357p:  ill;  24 cm. 
 - Advances in pattern recognition. .
<br/><br/><label>ISBN: </label>9781848002784 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Applied physics  <br/>Image processing<br/>Markov random fields
<br/><br/><label>Dewey Class. No.: </label>621.36701 LIS