Schroder, Dieter K., <br/><br/>
Semiconductor material and device characterization   
by Dieter K. Schroder 
 - 3rd ed.   
 - New Jersey:  Wiley,  c2006. . 
 - xv, 779 p.:  ill;  25cm. 
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 -   .
<br/><br/> Includes bibliographical references and index.  
<br/><br/><label>ISBN: </label>9780471739067 
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<br/><br/><label>Nat. Bib. No.: </label>  
<br/><br/><label>Nat. Bib. Agency Control No.: </label>  
<br/><br/><label>Subjects--Meeting Names: </label><br/>  
<br/><br/><label>Subjects--Index Terms: </label>Applied physics Semiconductors. Semiconductors -- Testing. Electronic books. 
<br/><br/><label>LC Class. No.: </label> /  
<br/><br/><label>Dewey Class. No.: </label>621.38152 SCH