TY  - BOOK
AU  - Yang, Fuqian ,
AU  - C.M. Li, James ,
TI  - Micro and nano mechanical testing of materials and devices
SN  - 9780387787008
U1  - 620.11 YAN 
PY  - 2008///
CY  - New York
PB  - Springer
N1  - Foreword by William D. Nix
ER  -