Thermal properties measurement of materials

By:

Jannot, Yves

Contributor(s):

Degiovanni, Alain [Co-author]

Material type:

TextPublication details: Wiley, 2024.ISBN:

9781119505983

Subject(s):

DDC classification:

621.38152 JAN

Online resources:

Click here to access e-book

Summary: This book presents the main methods used for thermal properties measurement. It aims to be accessible to all those, specialists in heat transfer or not, who need to measure the thermal properties of a material. The objective is to allow them to choose the measurement method the best adapted to the material to be characterized, and to pass on them all the theoretical and practical information allowing implementation with the maximum of precision.

List(s) this item appears in: IEEE-Wiley Semiconductor Ebooks

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Item type	Current library	Call number	Materials specified	URL	Status
E- Books	IIT Gandhinagar	621.38152 JAN (Browse shelf(Opens below))	IEEE-Wiley Semiconductor Ebooks	Link to resource	Available

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This book presents the main methods used for thermal properties measurement. It aims to be accessible to all those, specialists in heat transfer or not, who need to measure the thermal properties of a material. The objective is to allow them to choose the measurement method the best adapted to the material to be characterized, and to pass on them all the theoretical and practical information allowing implementation with the maximum of precision.

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