Process induced threshold voltage variability in Ultra-Thin Body and Buried Oxide Fully Depleted Silicon on Insulator (UTBB FDSOI) transistors
Material type: BookPublication details: Gandhinagar: Indian Institute of Technology Gandhinagar, 2021.Description: viii, 38 p. : ill. ; hb, 30 cmSubject(s): DDC classification:- 621.3 VER
Item type | Current library | Collection | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Theses | IIT Gandhinagar | Reference | 621.3 VER (Browse shelf(Opens below)) | Available | T00846 |
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