Transmission electron microscopy: physics of image formation

By:

Reimer, Ludwig

Contributor(s):

Kohl, Helmut

Series: Springer series in optical sciencesPublication details: Springer, 2010. New York:Description: xvi; 587 p. pb; 23 cmISBN:

9781441923080

Subject(s):

DDC classification:

502.825 REI

Summary: "Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analysed are the kinetical and dynamical theories of electron diffraction and their applications for crystal-structure determination and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. The third edition includes a brief discussionof Schottky emission guns, some clarification of minor details, and references to the recent literature.

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	502.825 REI (Browse shelf(Opens below))	Checked out	02/08/2024	028745

"Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analysed are the kinetical and dynamical theories of electron diffraction and their applications for crystal-structure determination and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. The third edition includes a brief discussionof Schottky emission guns, some clarification of minor details, and references to the recent literature.

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