Scanning electron microscopy and X-ray microanalysis

By:

Contributor(s):

Publication details: Springer, 2018. New York:Description: xxiii; 550 p. pb; 28 cmISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	620.11 GOL (Browse shelf(Opens below))	Checked out	31/07/2024	028742

There are no comments on this title.

to post a comment.