Introduction to focused Ion beams: instrumentation, theory, techniques and practice

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Publication details: Springer 2005 New York:Description: xiv, 357 p.; ill.: 24 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	621.38152 GIA (Browse shelf(Opens below))	Available		026916

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Previous	621.38152 DAD III-V compound semiconductors: integration with silicon-based microelectronics	621.38152 DUR High performance silicon imaging: fundamentals and applications of CMOS and CCD sensors : Series: Woodhead Publishing series in electronic and optical materials /	621.38152 DUT Semiconductor devices and circuits	621.38152 GIA Introduction to focused Ion beams: instrumentation, theory, techniques and practice	621.38152 GRE Semiconductor quantum dots: organometallic and inorganic synthesis	621.38152 KAO Wafer manufacturing: shaping of single crystal silicon	621.38152 KLI Nanocrystal quantum dots	Next

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