Design-for-test for digital IC`s and embedded core systems by Alfred L. Crouch

By:

Crouch, Alfred L

Material type: Book

BookLanguage: English Series: ; Current publication frequency: .Publication details: New Jersey: Prentice Hall, 1999.Edition: Description: 349 p.: ill.; 24 cmISBN:

9780130848277

Subject(s):

Applied physics
Automatic test equipment
Electronic circuit design
Embedded computer systems

DDC classification:

621.3815 CRO

LOC classification:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	621.3815 CRO (Browse shelf(Opens below))	Available		020242

Includes bibliographical references and index

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