Analysis and modeling of stress over layer induced threshold voltage shift in High-K metal gate MOSFETs
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- 621.3815284 PAR
Item type | Current library | Collection | Call number | Status | Date due | Barcode |
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IIT Gandhinagar | Reference | 621.3815284 PAR (Browse shelf(Opens below)) | Available | C00769 | |
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IIT Gandhinagar | Thesis | 621.3815284 PAR (Browse shelf(Opens below)) | Available | T00026 |
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Guide of this theses is Prof. Nihar R. Mohapatra
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