ESD : failure mechanisms and models by Steven H. Voldman

By:

Voldman, Steven H

Material type: Book

BookSeries: ; Current publication frequency: .Publication details: Hoboken, N.J. : John Wiley & Sons, 2009.Edition: Description: xxiv, 384 p. : ill; 25cmISBN:

9780470511374

Subject(s):

Applied physics
Semiconductors -- Failures
Integrated circuits -- Protection
Integrated circuits -- Testing
Integrated circuits -- Reliability
Electric discharges
Electrostatics

DDC classification:

621.381 VOL

LOC classification:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	621.381 VOL (Browse shelf(Opens below))	Available		010968

Includes bibliographical references and index.

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