Materials science in microelectronics Ii: the effects of structure on properties In yhin films : v. 2. The effects of structure on properties in thin films./ by Eugene Machlin .

By:

Material type: Book

BookSeries: ; Current publication frequency: .Publication details: Boston: Elsevier, 2005.Edition: 2nd edDescription: 2 v.: ill; 24cmISBN:

Subject(s):

DDC classification:

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	IIT Gandhinagar	General	621.38152 MAC (Browse shelf(Opens below))	Available		010798

Previous								Next
Previous	620.11 RAJ Material Science	671.52 MIS Friction Stir Welding and Processing	620.44 YEF Structure and thermodynamics of thin films	621.38152 MAC Materials science in microelectronics Ii: the effects of structure on properties In yhin films :	620.11 UPA Materials science and engineering	533.5 DEL Vacuum physics and techniques	681.4 FLO Thin films for optical systems	Next

Includes bibliographical references and indexes.

There are no comments on this title.

to post a comment.