Swift ion beam analysis in nanosciences (Record no. 64079)

MARC details
000 -LEADER
fixed length control field 01632nam a22002417a 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781119008736
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38152 JAL
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Jalabert, Denis
245 ## - TITLE STATEMENT
Title Swift ion beam analysis in nanosciences
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Wiley,
Date of publication, distribution, etc. 2024.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Include Biliograogy and Index
520 ## - SUMMARY, ETC.
Summary, etc. Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment.<br/><br/>Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Components
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Dielectrics and Plasmas
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Circuits
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Devices and Systems
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Engineered Materials
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element General Topics for Engineers
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Vickridge, Ian
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Chabli, Amal
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://ieeexplore.ieee.org/book/10518284">https://ieeexplore.ieee.org/book/10518284</a>
Link text Click here to access e-book
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type E- Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Materials specified (bound volume or other part) Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Date last seen Uniform Resource Identifier Price effective from Koha item type
    Dewey Decimal Classification IEEE-Wiley Semiconductor Ebooks     IIT Gandhinagar IIT Gandhinagar 08/11/2025   621.38152 JAL 08/11/2025 https://ieeexplore.ieee.org/book/10518284 08/11/2025 E- Books


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