Applications and metrology at nanometer-scale 2: measurement systems, quantum engineering and rbdo method (Record no. 62933)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01827nam a2200241 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781119818960 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 DAH |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Dahoo, Pierre-Richard |
| 245 ## - TITLE STATEMENT | |
| Title | Applications and metrology at nanometer-scale 2: measurement systems, quantum engineering and rbdo method |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Wiley, |
| Date of publication, distribution, etc. | 2024 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references and index |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power.<br/>This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Components |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Circuits |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Devices |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Systems |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electronic materials |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Nanomaterials |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Dielectrics |
| 856 ## - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="https://ieeexplore.ieee.org/servlet/opac?bknumber=10523206">https://ieeexplore.ieee.org/servlet/opac?bknumber=10523206</a> |
| Link text | Click here to access e-book |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | E- Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Materials specified (bound volume or other part) | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | IEEE-Wiley Semiconductor Ebooks | IIT Gandhinagar | IIT Gandhinagar | 13/06/2025 | 621.38152 DAH | 13/06/2025 | https://ieeexplore.ieee.org/servlet/opac?bknumber=10523206 | 13/06/2025 | E- Books |
