Nanometer variation-tolerant SRAM : circuits and statistical design for yield

Abu Rahma, Mohamed.

Nanometer variation-tolerant SRAM : circuits and statistical design for yield - New York : Springer, 2013. - xvi, 170p. : ill. ; 24 cm.

Includes bibliographical references and index.

9781493902200


Engineering
Computer-Aided Engineering
Electronic Circuits
Circuits
Systems
Computer
Hardware
Computer Engineering
Machine Theory
Computer Storage Devices
Random Access Memory
Integrated Circuits
Technology
Engineering
Electronics
Circuits
Nanoscience
Nanoscience
Science
Systems Engineering
Computer Aided Design

621.3815 / ABU


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